
IEC 60749-27 Ed. 2.0 b:2006
- Comments Off on IEC 60749-27 Ed. 2.0 b:2006
- IEC
Click here to purchase
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive
Product Details
- Edition:
- 2.0
- Published:
- 07/18/2006
- Number of Pages:
- 25
- File Size:
- 1 file , 530 KB