IEC 60749-17 Ed. 2.0 b:2019 - IEC

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IEC 60749-17 Ed. 2.0 b:2019

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IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Product Details

Published:: 03/28/2019
Number of Pages:: 17
File Size:: 1 file , 1000 KB

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