IEC 61131-1 Ed. 2.0 b:2003

Programmable controllers – Part 1: General information
standard by International Electrotechnical Commission, 05/22/2003

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IEC 61290-1-1 Ed. 3.0 en:2015

Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
standard by International Electrotechnical Commission, 05/07/2015

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IEC 61291-4 Ed. 1.0 b:2003

Optical amplifiers – Part 4: Multichannel applications – Performance specification template
standard by International Electrotechnical Commission, 05/20/2003

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IEC 61262-7 Ed. 1.0 b:1995

Medical electrical equipment – Characteristics of electro-optical X-ray image intensifiers – Part 7: Determination of the modulation transfer function
standard by International Electrotechnical Commission, 09/13/1995

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IEC 61307 Ed. 1.0 b:1994

Industrial microwave heating installations – Test methods for the determination of power output
standard by International Electrotechnical Commission, 07/14/1994

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IEC 61190-1-3 Ed. 3.0 b:2017

Attachment materials for electronic assembly – Part 1-3: Requirements for electronic grade solder alloys and fluxed and non-fluxed solid solder for electronic soldering applications
standard by International Electrotechnical Commission, 12/13/2017

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IEC 61253-2 Ed. 1.0 b:1993

Piezoelectric ceramic resonators – A Specification in the IEC quality assessment system for electronic components (IECQ) – Part 2: Sectional specification – Qualification approval
standard by International Electrotechnical Commission, 12/17/1993

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IEC 61219 Ed. 1.0 b CORR1:2000

Corrigendum 1 – Live working – Earthing or earthing and short-circuiting equipment using lances as a short-circuiting device – Lance earthing
Corrigenda by International Electrotechnical Commission, 05/26/2000

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IEC 61196-1-205 Ed. 1.0 b:2008

Coaxial communication cables – Part 1-205: Environmental test methods – Resistance to solvents and contaminating fluids
standard by International Electrotechnical Commission, 02/07/2008

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IEC 61160 Amd.1 Ed. 1.0 b:1994

Amendment 1 – Formal design review
Amendment by International Electrotechnical Commission, 09/28/1994

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