Insulating materials – Industrial rigid round laminated tubes and rods based on thermosetting resins for electrical purposes – Part 1: Definitions, designations and general requirements
standard by International Electrotechnical Commission, 03/08/2006
Reliability growth – Statistical test and estimation methods
standard by International Electrotechnical Commission, 03/24/2004
Nuclear reactors – Response time in resistance temperature detectors (RTD) – In situ measurements
standard by International Electrotechnical Commission, 05/13/1993
Ultrasonics – Pulse-echo scanners – Part 1: Techniques for calibrating spatial measurement systems and measurement of point-spread function response CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 07/10/2017
Metal halide lamps – Performance specification
standard by International Electrotechnical Commission, 04/27/2018
Safety of transformers, reactors, power supply units and combinations thereof – Part 2-10: Particular requirements and tests for separating transformers with high insulation level and separating transformers with output voltages exceeding 1 000 V
standard by International Electrotechnical Commission, 04/10/2014
Process measurement and control devices – General methods and procedures for evaluating performance – Part 1: General considerations
standard by International Electrotechnical Commission, 08/03/1995
Medical electrical equipment – Characteristics of electro-optical X-ray image intensifiers – Part 1: Determination of the entrance field size
standard by International Electrotechnical Commission, 07/14/1994
Materials for printed boards and other interconnecting structures – Part 2-13: Sectional specification set for reinforced base materials, clad and unclad – Cyanate ester non-woven aramid laminate of defined flammability, copper-clad
standard by International Electrotechnical Commission, 02/26/1999
Household high-fidelity audio equipment and systems – Methods of measuring and specifying the performance – Part 1: General
standard by International Electrotechnical Commission, 05/05/1995
