IEC 61443 Ed. 1.0 b:1999

Short-circuit temperature limits of electric cables with rated voltages above 30 kV (Um = 36 kV)
standard by International Electrotechnical Commission, 07/09/1999

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IEC 61628-2 Amd.1 Ed. 1.0 b:2007

Amendment 1 – Corrugated pressboard and presspaper for electrical purposes – Part 2: Methods of test
Amendment by International Electrotechnical Commission, 06/06/2007

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IEC 61342 Ed. 1.0 b:1995

Nuclear instrumentation – Multichannel pulse height analyzers – Main characteristics, technical requirements and test methods
standard by International Electrotechnical Commission, 03/01/1995

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IEC 61189-5-2 Ed. 1.0 b:2015

Test methods for electrical materials, printed boards and other interconnection structures and assemblies – Part 5-2: General test methods for materials and assemblies – Soldering flux for printed board assemblies
standard by International Electrotechnical Commission, 01/08/2015

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IEC 61188-5-3 Ed. 1.0 en:2007

Printed boards and printed board assemblies – Design and use – Part 5-3: Attachment (land/joint) considerations – Components with gull-wing leads on two sides
standard by International Electrotechnical Commission, 10/30/2007

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IEC 61587-1 Ed. 1.0 b:1999

Mechanical structures for electronic equipment – Tests for IEC 60917 and IEC 60297 – Part 1: Climatic, mechanical tests and safety aspects for cabinets, racks, subracks and chassis
standard by International Electrotechnical Commission, 06/17/1999

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IEC 61178-3 Ed. 1.0 b:1993

Quartz crystal units – A specification in the IEC Quality Assessment System for Electronic Components (IECQ) – Part 3: Sectional specification – Qualification approval
standard by International Electrotechnical Commission, 03/31/1993

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IEC 61290-3-1 Ed. 1.0 b:2003

Optical amplifiers – Test methods – Part 3-1: Noise figure parameters – Optical spectrum analyzer method
standard by International Electrotechnical Commission, 08/26/2003

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IEC 61243-2 Ed. 1.2 b:2002

Live working – Voltage detectors – Part 2: Resistive type to be used for voltages of 1 kV to 36 kV a.c. CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 06/25/2002

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IEC 61336 Ed. 1.0 b:1996

Nuclear instrumentation – Thickness measurement systems utilizingionizing radiation – Definitions and test methods
standard by International Electrotechnical Commission, 11/28/1996

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