IEC 61511-1 Ed. 1.0 b CORR1:2004

Corrigendum 1 – Functional safety – Safety instrumented systems for the process industry sector – Part 1: Framework, definitions, system, hardware and software requirements
Corrigenda by International Electrotechnical Commission, 11/29/2004

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IEC 61391-1 Ed. 1.0 b:2006

Ultrasonics – Pulse-echo scanners – Part 1: Techniques for calibrating spatial measurement systems and measurement of system point-spread function response
standard by International Electrotechnical Commission, 07/11/2006

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IEC 61340-5-2 TR Ed. 1.0 b CORR1:2009

Corrigendum 1 – Electrostatics – Part 5-2: Protection of electronic devices from electrostatic phenomena – User guide
Amendment by International Electrotechnical Commission, 05/26/2009

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IEC 61508-6 Ed. 2.0 b:2010

Functional safety of electrical/electronic/programmable electronic safety-related systems – Part 6: Guidelines on the application of IEC 61508-2 and IEC 61508-3 (see
standard by International Electrotechnical Commission, 04/30/2010

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IEC 61675-3 Ed. 1.0 en:1998

Radionuclide imaging devices – Characteristics and test conditions – Part 3: Gamma camera based wholebody imaging systems
standard by International Electrotechnical Commission, 02/26/1998

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IEC 61477 Amd.1 Ed. 1.0 b:2002

Amendment 1 – Live working – Minimum requirements for the utilization of tools, devices and equipment
Amendment by International Electrotechnical Commission, 05/08/2002

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IEC 61511-3 Ed. 1.0 b:2003

Functional safety – Safety instrumented systems for the process industry sector – Part 3: Guidance for the determination of the required safety integrity levels
standard by International Electrotechnical Commission, 03/18/2003

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IEC 61332 Ed. 1.0 b:1995

Soft ferrite material classification
standard by International Electrotechnical Commission, 10/11/1995

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IEC 61508-4 Ed. 1.0 b CORR1:1999

Corrigendum 1 – Functional safety of electrical/electronic/programmable electronic safety-related systems – Part 4: Definitions and abbreviations
Corrigenda by International Electrotechnical Commission, 04/01/1999

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IEC 61580 Ed. 1.0 b:1995

Measurement of return loss on waveguide and waveguide assemblies
standard by International Electrotechnical Commission, 11/22/1995

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