IEC 62271-203 Ed. 1.0 b:2003

High-voltage switchgear and controlgear – Part 203: Gas-insulated metal-enclosed switchgear for rated voltages above 52 kV
standard by International Electrotechnical Commission, 11/06/2003

IEC 62065 Ed. 2.0 en:2014

Maritime navigation and radiocommunication equipment and systems – Track control systems – Operational and performance requirements, methods of testing and required test results
standard by International Electrotechnical Commission, 02/06/2014

IEC 62056-6-2 Ed. 3.0 b:2017

Electricity metering data exchange – The DLMS/COSEM suite – Part 6-2: COSEM interface classes
standard by International Electrotechnical Commission, 09/06/2017

IEC 61834-10 Ed. 1.0 b:2001

Recording – Helical-scan digital video cassette recording system using 6,35 mm magnetic tape for consumer use (525-60, 625-50, 1125-60 and 1250-50 systems) – Part 10: DTV format
standard by International Electrotechnical Commission, 02/22/2001

IEC 61800-7-1 Ed. 1.0 b:2007

Adjustable speed electrical power drive systems – Part 7-1: Generic interface and use of profiles for power drive systems – Interface definition
standard by International Electrotechnical Commission, 11/27/2007

IEC 61968-9 Ed. 2.0 b:2013

Application integration at electric utilities – System interfaces for distribution management – Part 9: Interfaces for meter reading and control
standard by International Electrotechnical Commission, 10/16/2013

IEC 61951-1 Ed. 3.0 b:2013

Secondary cells and batteries containing alkaline or other non-acid electrolytes – Portable sealed rechargeable single cells – Part 1: Nickel-cadmium
standard by International Electrotechnical Commission, 10/15/2013

IEC 62236-3-2 Ed. 1.0 b:2003

Railway applications – Electromagnetic compatibility – Part 3-2: Rolling stock – Apparatus
standard by International Electrotechnical Commission, 04/24/2003

IEC 61724-1 Ed. 1.0 en:2017

Photovoltaic system performance – Part 1: Monitoring
standard by International Electrotechnical Commission, 03/03/2017

IEC 62047-10 Ed. 1.0 b CORR1:2012

Corrigendum 1 – Semiconductor devices – Micro-electromechanical devices – Part 10: Micro-pillar compression test for MEMS materials
Corrigenda by International Electrotechnical Commission, 02/28/2012