IEC 62435-1 Ed. 1.0 b:2017

Electronic components – Long-term storage of electronic semiconductor devices – Part 1: General
standard by International Electrotechnical Commission, 01/20/2017

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IEC 62568 Ed. 1.0 b:2015

Overhead lines – Method for fatigue testing of conductors
standard by International Electrotechnical Commission, 07/09/2015

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IEC 62037-2 Ed. 1.0 en:2012

Passive RF and microwave devices, intermodulation level measurement – Part 2: Measurement of passive intermodulation in coaxial cable assemblies
standard by International Electrotechnical Commission, 11/07/2012

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IEC 61996 Ed. 1.0 en:2000

Maritime navigation and radiocommunication equipment and systems – Shipborne voyage data recorder (VDR) – Performance requirements – Methods of testing and required test results
standard by International Electrotechnical Commission, 07/31/2000

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IEC 62423 Ed. 2.0 b:2009

Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
standard by International Electrotechnical Commission, 11/20/2009

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IEC 61770 Ed. 2.0 b:2008

Electric appliances connected to the water mains – Avoidance of backsiphonage and failure of hose-sets
standard by International Electrotechnical Commission, 07/23/2008

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IEC 62433-2 Ed. 1.0 en:2008

EMC IC modelling – Part 2: Models of integrated circuits for EMI behavioural simulation – Conducted emissions modelling (ICEM-CE)
standard by International Electrotechnical Commission, 10/08/2008

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IEC 62106 Ed. 2.0 en:2009

Specification of the Radio Data System (RDS) for VHF/FM sound broadcasting in the frequency range from 87,5 MHz to 108,0 MHz
standard by International Electrotechnical Commission, 07/30/2009

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IEC 62037-1 Ed. 1.0 en:2012

Passive RF and microwave devices, intermodulation level measurement – Part 1: General requirements and measuring methods
standard by International Electrotechnical Commission, 05/29/2012

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IEC 62002-2 Ed. 2.0 en:2008

Mobile and portable DVB-T/H radio access – Part 2: Interface conformance testing
standard by International Electrotechnical Commission, 05/21/2008

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