IEC 61788-2 Ed. 1.0 b:1999

Superconductivity – Part 2: Critical current measurement – DC critical current of Nb3Sn composite superconductors
standard by International Electrotechnical Commission, 03/19/1999

IEC 62479 Ed. 1.0 b:2010

Assessment of the compliance of low-power electronic and electrical equipment with the basic restrictions related to human exposure to electromagnetic fields (10 MHz to 300 GHz)
standard by International Electrotechnical Commission, 06/16/2010

IEC 62459 Ed. 1.0 en:2010

Sound system equipment – Electroacoustical transducers – Measurement of suspension parts
standard by International Electrotechnical Commission, 01/27/2010

IEC 61788-1 Ed. 1.0 b:1998

Superconductivity – Part 1: Critical current measurement – DC critical current of Cu/Nb-Ti composite superconductors
standard by International Electrotechnical Commission, 02/19/1998

IEC 62613-1 Ed. 1.0 b:2011

Plugs, socket-outlets and ship couplers for high-voltage shore connection systems (HVSC-Systems) – Part 1: General requirements
standard by International Electrotechnical Commission, 06/29/2011

IEC 62530 Ed. 1.0 en:2007

Standard for SystemVerilog – Unified Hardware Design, Specification, and Verification Language
standard by International Electrotechnical Commission, 11/07/2007

IEC 62481-3 Ed. 3.0 en:2017

Digital living network alliance (DLNA) home networked device interoperability guidelines – Part 3: DLNA link protection
standard by International Electrotechnical Commission, 07/27/2017

IEC 62086-1 Ed. 1.0 b:2001

Electrical apparatus for explosive gas atmospheres – Electrical resistance trace heating – Part 1: General and testing requirements
standard by International Electrotechnical Commission, 01/30/2001

IEC 62443-3-3 Ed. 1.0 en:2013

Industrial communication networks – Network and system security – Part 3-3: System security requirements and security levels
standard by International Electrotechnical Commission, 08/07/2013

IEC 62271-101 Amd.1 Ed. 2.0 b:2017

Amendment 1 – High-voltage switchgear and controlgear – Part 101: Synthetic testing
Amendment by International Electrotechnical Commission, 11/30/2017