IEC 62228-3 Ed. 1.0 b:2019

Integrated circuits – EMC evaluation of transceivers – Part 3: CAN transceivers
standard by International Electrotechnical Commission, 03/11/2019

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IEC 61935-1 Ed. 2.0 b:2005

Testing of balanced communication cabling in accordance with ISO/IEC 11801 – Part 1: Installed cabling
standard by International Electrotechnical Commission, 08/11/2005

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IEC 62298-1 Ed. 1.0 en:2005

Teleweb application – Part 1: General description
standard by International Electrotechnical Commission, 05/18/2005

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IEC 61788-21 Ed. 1.0 b:2015

Superconductivity – Part 21: Superconducting wires – Test methods for practical superconducting wires – General characteristics and guidance
standard by International Electrotechnical Commission, 05/19/2015

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IEC 61754-6 Ed. 1.2 b:2005

Fibre optic connector interfaces – Part 6: Type MU connector family CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 12/07/2005

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IEC 62271-1 Ed. 2.0 b:2017

High-voltage switchgear and controlgear – Part 1: Common specifications for alternating current switchgear and controlgear
standard by International Electrotechnical Commission, 07/12/2017

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IEC 61967-5 Ed. 1.0 b:2003

Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 5: Measurement of conducted emissions – Workbench Faraday Cage method
standard by International Electrotechnical Commission, 02/13/2003

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IEC 61753-091-2 Ed. 1.0 b:2012

Fibre optic interconnecting devices and passive components – Performance standard – Part 091-2: Non-connectorized single-mode fibre optic pigtailed circulators for category C – Controlled environments
standard by International Electrotechnical Commission, 10/12/2012

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IEC 62219 Ed. 1.0 b:2002

Overhead electrical conductors – Formed wire, concentric lay, stranded conductors
standard by International Electrotechnical Commission, 02/20/2002

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IEC 62424 Ed. 1.0 b:2008

Representation of process control engineering – Requests in P&I diagrams and data exchange between P&ID tools and PCE-CAE tools
standard by International Electrotechnical Commission, 08/12/2008

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