Semiconductor devices – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) – Part 1: Fast BTI test for MOSFET
standard by International Electrotechnical Commission, 07/15/2020
Amendment 1 – Medical electrical equipment – Part 1-12: General requirements for basic safety and essential performance – Collateral Standard: Requirements for medical electrical equipment and medical electrical systems intended for use in the emergency medical services environment
Amendment by International Electrotechnical Commission, 07/22/2020
Piezoelectric sensors – Part 3: Physical sensors
standard by International Electrotechnical Commission, 08/12/2020
Fibre optic active components and devices – Package and interface standards – Part 19: Photonic chip scale package
standard by International Electrotechnical Commission, 05/02/2019
Surface mounted piezoelectric devices for frequency control and selection – Standard outlines and terminal lead connections – Part 2: Ceramic enclosures CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 09/24/2020
Amendment 1 – Electromagnetic compatibility (EMC) – Part 3-2: Limits – Limits for harmonic current emissions (equipment input current 16 A per phase)
Amendment by International Electrotechnical Commission, 07/14/2020
Luminaires – Part 2-23: Particular requirements – Extra low voltage lighting systems for filament lamps
standard by International Electrotechnical Commission, 07/20/2020
Field device integration (FDI) – Part 115-2: Profiles – Modbus-RTU
standard by International Electrotechnical Commission, 09/25/2020
Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices
standard by International Electrotechnical Commission, 07/22/2020
Electrical equipment for measurement, control and laboratory use – EMC requirements – Part 1: General requirements
standard by International Electrotechnical Commission, 10/26/2020
