IEC 60068-2-69 Ed. 2.0 en:2007

Environmental testing – Part 2-69: Tests – Test Te: Solderability testing of electronic components for surface mounting devices (SMD) by the wetting balance method
standard by International Electrotechnical Commission, 05/09/2007

IEC 62282-8-102 Ed. 1.0 b:2019

Fuel cell technologies – Part 8-102: Energy storage systems using fuel cell modules in reverse mode – Test procedures for the performance of single cells and stacks with proton exchange membrane, including reversible operation
standard by International Electrotechnical Commission, 12/13/2019

IEC 60050-731 Ed. 1.0 b:1991

International Electrotechnical Vocabulary – Chapter 731: Optical fibre communication
standard by International Electrotechnical Commission, 12/24/1991

IEC 60068-2-69 Amd.1 Ed. 3.0 b:2017

Amendment 1 – Environmental testing – Part 2-69: Tests – Test Te/Tc: Solderability testing of electronic components and printed boards by the wetting balance (force measurement) method
Amendment by International Electrotechnical Commission, 06/19/2019

IEC 60027-3 Ed. 3.0 b:2002

Letter symbols to be used in electrical technology – Part 3: Logarithmic and related quantities, and their units
standard by International Electrotechnical Commission, 07/19/2002

IEC 60050-705 Ed. 1.0 t:1995

International Electrotechnical Vocabulary (IEV) – Part 705: Radio wave propagation
standard by International Electrotechnical Commission, 09/29/1995

IEC 62003 Ed. 2.0 b:2020

Nuclear power plants – Instrumentation and control important to safety – Requirements for electromagnetic compatibility testing
standard by International Electrotechnical Commission, 03/11/2020

IEC 60050-351 Ed. 4.0 b:2013

International Electrotechnical Vocabulary (IEV) – Part 351: Control technology
standard by International Electrotechnical Commission, 11/25/2013

IEC 62812 Ed. 1.0 b:2019

Low resistance measurements – Methods and guidance
standard by International Electrotechnical Commission, 05/02/2019

IEC 60747-5-9 Ed. 1.0 en:2019

Semiconductor devices – Part 5-9: Optoelectronic devices – Light emitting diodes – Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
standard by International Electrotechnical Commission, 12/11/2019