IEC 60512-12-1 Ed. 1.0 b:2006

Connectors for electronic equipment – Tests and measurements – Part 12-1: Soldering tests – Test 12a: Solderability, wetting, solder bath method
standard by International Electrotechnical Commission, 03/23/2006

IEC 60626-3 Amd.1 Ed. 2.0 b:1999

Amendment 1 – Combined flexible materials for electrical insulation – Part 3: Specifications for individual materials
Amendment by International Electrotechnical Commission, 06/30/1999

IEC 60466 Ed. 2.0 b:1987

A.C. insulation-enclosed switchgear and controlgear for rated voltages above 1 kV and up to and including 38 kV
standard by International Electrotechnical Commission, 01/01/1987

IEC 60684-3-100 Ed. 2.0 b:2001

Flexible insulating sleeving – Part 3: Specifications for individual types of sleeving – Sheets 100 to 105: Extruded PVC sleeving
standard by International Electrotechnical Commission, 07/10/2001

IEC 60601-2-13 Ed. 3.0 en:2003

Medical electrical equipment – Part 2-13: Particular requirements for the safety and essential performance of anaesthetic systems
standard by International Electrotechnical Commission, 05/27/2003

IEC 60721-3-6 Ed. 1.0 b CORR1:1987

Corrigendum 1 – Classification of environmental conditions. Part 3: Classification of groups of environmental parameters and their severities. Ship environment
Corrigenda by International Electrotechnical Commission, 09/01/1987

IEC 60440 Ed. 1.0 b:2012

Method of measurement of non-linearity in resistors
standard by International Electrotechnical Commission, 07/13/2012

IEC 60353 Ed. 2.0 b:1989

Line traps for a.c. power systems
standard by International Electrotechnical Commission, 11/15/1989

IEC 60384-2 Ed. 3.0 en:2005

Fixed capacitors for use in electronic equipment – Part 2: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric d.c. capacitors
standard by International Electrotechnical Commission, 11/09/2005

IEC 60368-3 Ed. 4.0 b:2010

Piezoelectric filters of assessed quality – Part 3: Standard outlines and lead connections
standard by International Electrotechnical Commission, 11/25/2010