Hand-held motor-operated electric tools – Safety – Part 2-13: Particular requirements for chain saws CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 04/14/2011
Cable networks for television signals, sound signals and interactive services – Part 3-1: Active wideband equipment for cable networks – Methods of measurement of non-linearity for full digital channel load with DVB-C signals
standard by International Electrotechnical Commission, 07/06/2012
Combined flexible materials for electrical insulation – Part 1: Definitions and general requirements
standard by International Electrotechnical Commission, 07/04/1995
Medical electrical equipment – Part 2: Particular requirements for the safety of electrocardiographs
standard by International Electrotechnical Commission, 03/19/1993
Short-circuit temperature limits of electric cables with rated voltages of 1 kV (<i>U</i><sub>m</sub> = 1,2 kV) and 3 kV (<i>U</i><sub>m</sub> = 3,6 kV)
standard by International Electrotechnical Commission, 10/09/2000
Classification of environmental conditions – Part 3-3: Classification of groups of environmental parameters and their severities – Stationary use at weatherprotected locations CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 10/22/2002
Amendment 1 – Test on gases evolved during combustion of electric cables – Part 2: Determination of degree of acidity of gases evolved during the combustion of materials taken from electric cables by measuring pH and conductivity
Amendment by International Electrotechnical Commission, 04/16/1997
Boxes and enclosures for electrical accessories for household andsimilar fixed electrical installations – Part 22: Particular requirements for connecting boxes and enclosures CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 03/27/2015
Guide for determining the effects of ionizing radiation on insulating materials – Part 2: Procedures for irradiation and test
standard by International Electrotechnical Commission, 08/23/1991
Corrigendum 1 – Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Corrigenda by International Electrotechnical Commission, 08/12/2003
