IEC 60619 Amd.1 Ed. 2.0 b:1995

Amendment 1 – Electrically operated food preparation appliances – Methods for measuring the performance
Amendment by International Electrotechnical Commission, 08/30/1995

IEC 60454-3-7 Ed. 2.0 b:1998

Pressure-sensitive adhesive tapes for electrical purposes – Part 3: Specifications for individual materials – Sheet 7: Polyimide film tapes with pressure-sensitive adhesive
standard by International Electrotechnical Commission, 03/16/1998

IEC 60793-1-33 Ed. 2.0 b:2017

Optical fibres – Part 1-33: Measurement methods and test procedures – Stress corrosion susceptibility
standard by International Electrotechnical Commission, 08/16/2017

IEC 60759 Amd.1 Ed. 1.0 b:1991

Amendment 1 – Standard test procedures for semiconductor X-ray energy spectrometers
Amendment by International Electrotechnical Commission, 11/15/1991

IEC 60674-2 Ed. 2.0 en:2016

Specification for plastic films for electrical purposes – Part 2: Methods of test
standard by International Electrotechnical Commission, 11/18/2016

IEC 60669-1 Amd.2 Ed. 3.0 b:2006

Amendment 2 – Switches for household and similar fixed-electrical installations – Part 1: General requirements
Amendment by International Electrotechnical Commission, 10/11/2006

IEC 60598-1 Amd.1 Ed. 6.0 b:2006

Amendment 1 – Luminaires – Part 1: General requirements and tests
Amendment by International Electrotechnical Commission, 07/24/2006

IEC 60384-4-1 Ed. 2.0 en:2000

Fixed capacitors for use in electronic equipment – Part 4: Blank detail specification – Aluminium electrolytic capacitors with non-solid electrolyte – Assessment level E
standard by International Electrotechnical Commission, 05/30/2000

IEC 60384-19-1 Ed. 2.0 en:2006

Fixed capacitors for use in electronic equipment – Part 19-1: Blank detail specification – Fixed metallized polyethylene-terephthalate film dielectric surface mount d.c. capacitors – Assessment level EZ
standard by International Electrotechnical Commission, 01/25/2006

IEC 60749-30 Ed. 1.0 b:2005

Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
standard by International Electrotechnical Commission, 01/20/2005