Amendment 1 – Semiconductor devices – Part 16-3: Microwave integrated circuits – Frequency converters
Amendment by International Electrotechnical Commission, 03/10/2009
Terms and nomenclature for cores made of magnetically soft ferrites – Part 3: Guidelines on the format of data appearing in manufacturers' catalogues of transformer and inductor cores
standard by International Electrotechnical Commission, 10/08/2003
Semiconductor devices – Part 16-2: Microwave integrated circuits – Frequency prescalers CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 01/22/2008
Classification of environmental conditions – Part 3: Classification of groups of environmental parameters and their severities – Introduction CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 10/22/2002
Voltage bands for electrical installations of buildings
standard by International Electrotechnical Commission, 01/01/1973
Fire hazard testing – Part 2-11: Glowing/hot-wire based test methods – Glow-wire flammability test method for end-products (GWEPT)
standard by International Electrotechnical Commission, 02/06/2014
Connectors for electronic equipment – Tests and measurements – Part 11-14: Climatic tests – Test 11p: Flowing single gas corrosion test
standard by International Electrotechnical Commission, 07/24/2003
Semiconductor devices – Mechanical and climatic test methods – Part 9: Permanence of marking
standard by International Electrotechnical Commission, 03/03/2017
Flexible insulating sleeving – Part 3: Specifications for individual types of sleeving – Sheet 247: Heat-shrinkable, polyolefin sleeving, dual wall, not flame retarded, thick and medium wall
standard by International Electrotechnical Commission, 06/23/2011
Optical fibres – Part 1-41: Measurement methods and test procedures – Bandwidth
standard by International Electrotechnical Commission, 08/31/2010
