Amendment 1 – Medical electrical equipment. Part 2: Particular requirements for the safety of transport incubators
Amendment by International Electrotechnical Commission, 10/25/1996
Semiconductor devices – Discrete devices – Part 7: Bipolar transistors – Section One: Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification
standard by International Electrotechnical Commission, 03/31/1989
Safety of hand-held motor-operated electric tools. Part 2: Particular requirements for hedge trimmers and grass shears
standard by International Electrotechnical Commission, 01/01/1984
Values for the difference between free-field and pressure sensitivity levels for one-inch standard condenser microphones
standard by International Electrotechnical Commission, 01/01/1979
Corrigendum 1 – Optical fibres – Part 1-42: Measurement methods and test procedures – Chromatic dispersion
Corrigenda by International Electrotechnical Commission, 06/14/2007
Corrigendum 1 – Semiconductor devices – Mechanical and climatic test methods – Part 3: External visual examination
Corrigenda by International Electrotechnical Commission, 08/12/2003
Specification for plastic films for electrical purposes. Part 1: Definitions and general requirements
standard by International Electrotechnical Commission, 01/01/1980
Connectors for electronic equipment – Tests and measurements – Part 1: General
standard by International Electrotechnical Commission, 01/30/2001
Magnetic materials – Part 8: Specifications for individual materials – Section 8: Specification for thin magnetic steel strip for use at medium frequencies
standard by International Electrotechnical Commission, 09/15/1991
Semiconductor devices – Mechanical and climatic test methods – Part 18: Ionizing radiation (total dose)
standard by International Electrotechnical Commission, 04/10/2019
