Semiconductor devices – Discrete devices – Part 7: Bipolar transistors – Section One: Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification
standard by International Electrotechnical Commission, 03/31/1989
Safety of hand-held motor-operated electric tools. Part 2: Particular requirements for hedge trimmers and grass shears
standard by International Electrotechnical Commission, 01/01/1984
Electrical supply track systems for luminaires CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 04/05/2017
Methods of measurement for equipment used in terrestrial radio-relay systems. Part 2: Measurements for sub-systems. Section Six: Diversity, twin-path and hot stand-by equipment
standard by International Electrotechnical Commission, 01/01/1984
Corrigendum 1 – Optical fibres – Part 1-42: Measurement methods and test procedures – Chromatic dispersion
Corrigenda by International Electrotechnical Commission, 06/14/2007
Corrigendum 1 – Semiconductor devices – Mechanical and climatic test methods – Part 3: External visual examination
Corrigenda by International Electrotechnical Commission, 08/12/2003
Corrigendum 1 – Degrees of protection provided by enclosures (IP Code)
Amendment by International Electrotechnical Commission, 01/16/2019
Semiconductor devices – Mechanical and climatic test methods – Part 18: Ionizing radiation (total dose)
standard by International Electrotechnical Commission, 04/10/2019
Methods for measuring the performance of electric household coffee makers CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 02/21/2006
Amendment 1 – Hand-held motor-operated electric tools – Safety – Part 2-2: Particular requirements for screwdrivers and impact wrenches
Amendment by International Electrotechnical Commission, 05/21/2008
