IEC 60539-1 Ed. 2.0 b:2008
Directly heated negative temperature coefficient thermistors – Part 1: Generic specification
standard by International Electrotechnical Commission, 02/13/2008
- Comments Off on IEC 60539-1 Ed. 2.0 b:2008
- IEC
Directly heated negative temperature coefficient thermistors – Part 1: Generic specification
standard by International Electrotechnical Commission, 02/13/2008
Methods of measurement for radio equipment used in satellite earth stations. Part 2: Measurements for sub-systems. Section Seven: High-power amplifier
standard by International Electrotechnical Commission, 01/30/1989
Medical electrical equipment – Part 2-49: Particular requirements for the basic safety and essential performance of multifunction patient monitoring equipment
standard by International Electrotechnical Commission, 02/25/2011
Semiconductor devices – Mechanical and climatic test methods – Part 34: Power cycling
standard by International Electrotechnical Commission, 03/10/2004
Amendment 1 – Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life
Amendment by International Electrotechnical Commission, 01/27/2011
Guide for commissioning, operation and maintenance of hydraulic turbines
standard by International Electrotechnical Commission, 01/01/1976
Automatic electrical controls for household and similar use – Part 2-12: Particular requirements for electrically operated door locks
standard by International Electrotechnical Commission, 08/30/2005
Amendment 1 – Hand-held motor-operated electric tools – Safety – Part 2-2: Particular requirements for screwdrivers and impact wrenches
Amendment by International Electrotechnical Commission, 05/21/2008
Amendment 1 – Varnishes used for electrical insulation – Part 1: Definitions and general requirements
Amendment by International Electrotechnical Commission, 01/17/2006
Methods of measurement for radio equipment used in satellite earth stations. Part 2: Measurements for sub-systems. Section Four: Up- and down-converters
standard by International Electrotechnical Commission, 12/30/1988