Connectors for electronic equipment – Tests and measurements – Part 8-1: Static load tests (fixed connectors) – Test 8a: Static load, transverse
standard by International Electrotechnical Commission, 06/10/2010
Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
standard by International Electrotechnical Commission, 04/12/2002
Amendment 2 – Connectors for electronic equipment – Part 7: Detail specification for 8-way, unshielded, free and fixed connectors
Amendment by International Electrotechnical Commission, 01/11/2019
Medical electrical equipment – Part 2-16: Particular requirements for the safety of haemodialysis, haemodiafiltration and haemofiltration equipment
standard by International Electrotechnical Commission, 02/23/1998
Luminaires – Part 2-24: Particular requirements – Luminaires with limited surface temperatures
standard by International Electrotechnical Commission, 06/19/2013
Flexible insulating sleeving – Part 3: Specifications for individual types of sleeving – Sheets 116 and 117: Extruded polychloroprene – General purpose
standard by International Electrotechnical Commission, 04/29/2003
Amendment 1 – Medical electrical equipment – Part 2-1: Particular requirements for the basic safety and essential performance of electron accelerators in the range 1 MeV to 50 MeV
Amendment by International Electrotechnical Commission, 07/21/2014
Electromechanical components for electronic equipment – Basic testing procedures and measuring methods – Part 1: General – Section 4: Test 1d: Contact protection effectiveness (scoop-proof)
standard by International Electrotechnical Commission, 07/30/1997
Amendment 2 – Methods for measuring the performance of electric warming plates for household and similar purposes
Amendment by International Electrotechnical Commission, 10/14/1992
Semiconductor devices – Discrete devices – Part 4: Microwave diodes and transistors
standard by International Electrotechnical Commission, 08/23/2007
