IEC 60695-8-1 Ed. 3.0 b:2016

Fire hazard testing – Part 8-1: Heat release – General guidance
standard by International Electrotechnical Commission, 11/15/2016

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IEC 60684-3-218 Ed. 1.0 b:1998

Flexible insulating sleeving – Part 3: Specifications for individual types of sleeving – Sheet 218: Heat-shrinkable polyolefin sleeving, not flame retarded, shrink ratio 3:1
standard by International Electrotechnical Commission, 06/19/1998

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IEC 60599 Ed. 2.1 b:2007

Mineral oil-impregnated electrical equipment in service – Guide to the interpretation of dissolved and free gases analysis CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 05/15/2007

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IEC 60749-4 Ed. 1.0 b:2002

Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
standard by International Electrotechnical Commission, 04/12/2002

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IEC 60695-10-3 Ed. 1.0 b:2002

Fire hazard testing – Part 10-3: Abnormal heat – Mould stress relief distortion test
standard by International Electrotechnical Commission, 04/30/2002

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IEC 60533 Ed. 2.0 en:1999

Electrical and electronic installations in ships – Electromagnetic compatibility
standard by International Electrotechnical Commission, 11/16/1999

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IEC 60404-15 Ed. 1.0 b:2012

Magnetic materials – Part 15: Methods for the determination of the relative magnetic permeability of feebly magnetic materials
standard by International Electrotechnical Commission, 09/18/2012

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IEC 60603-7-2 Ed. 2.0 b:2010

Connectors for electronic equipment – Part 7-2: Detail specification for 8-way, unshielded, free and fixed connectors, for data transmissions with frequencies up to 100 MHz
standard by International Electrotechnical Commission, 04/26/2010

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IEC 60598-2-9 Ed. 2.0 b:1987

Luminaires. Part 2: Particular requirements. Section Nine: Photo and film luminaires (non-professional)
standard by International Electrotechnical Commission, 11/15/1987

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IEC 60747-4 Ed. 2.0 b:2007

Semiconductor devices – Discrete devices – Part 4: Microwave diodes and transistors
standard by International Electrotechnical Commission, 08/23/2007

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