Semiconductor devices – Discrete devices – Part 7: Bipolar transistors – Section Two: Blank detail specification for case-rated bipolar transistors for low-frequency amplification
standard by International Electrotechnical Commission, 03/31/1989
Fire hazard testing – Part 10-2: Abnormal heat – Ball pressure test method
standard by International Electrotechnical Commission, 02/19/2014
Semiconductor devices – Integrated circuits – Part 1: General
standard by International Electrotechnical Commission, 05/08/2002
Luminaires – Part 2: Particular requirements – Section 2: Recessed luminaires CONSOLIDATED EDITION CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 09/10/1997
Amendment 1 – Laboratory resistors. Laboratory d.c. resistors
Amendment by International Electrotechnical Commission, 10/17/1997
Corrigendum 1 – Fire hazard testing – Part 10-2: Abnormal heat – Ball pressure test
Corrigenda by International Electrotechnical Commission, 02/09/2006
Flexible insulating sleeving – Part 3: Specifications for individual types of sleeving – Sheet 216: Heat-shrinkable, flame-retarded, limited-fire-hazard sleeving CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 03/29/2005
Pressboard and presspaper for electrical purposes – Part 3: Specifications for individual materials – Sheet 2: Requirements for presspaper, types P.2.1, P.4.1, P.4.2, P.4.3 and P.6.1
standard by International Electrotechnical Commission, 01/30/2008
High-voltage fuses for the external protection of shunt capacitors
standard by International Electrotechnical Commission, 04/23/2013
Variable capacitors – Part 3: Type specification for variable trimmer capacitors Type B – First supplement: Blank detail specification
standard by International Electrotechnical Commission, 01/01/1980
