Connectors for electronic equipment – Tests and measurements – Part 19-1: Chemical resistance tests – Test 19a: Fluid resistance of pre-insulated crimp barrels
standard by International Electrotechnical Commission, 03/24/2010
Semiconductor devices – Discrete devices – Part 7: Bipolar transistors – Section Two: Blank detail specification for case-rated bipolar transistors for low-frequency amplification
standard by International Electrotechnical Commission, 03/31/1989
Semiconductor devices – Integrated circuits – Part 1: General
standard by International Electrotechnical Commission, 05/08/2002
Fire hazard testing – Part 10-2: Abnormal heat – Ball pressure test method
standard by International Electrotechnical Commission, 02/19/2014
Luminaires – Part 2: Particular requirements – Section 2: Recessed luminaires CONSOLIDATED EDITION CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 09/10/1997
Optical fibres – Part 2-40: Product specifications – Sectional specification for category A4 multimode fibres
standard by International Electrotechnical Commission, 04/20/2009
Amendment 1 – Laboratory resistors. Laboratory d.c. resistors
Amendment by International Electrotechnical Commission, 10/17/1997
Equipment for continuous monitoring of radioactivity in gaseous effluents – Part 3: Specific requirements for radioactive noble gas monitors
standard by International Electrotechnical Commission, 01/17/2002
Pressboard and presspaper for electrical purposes – Part 3: Specifications for individual materials – Sheet 2: Requirements for presspaper, types P.2.1, P.4.1, P.4.2, P.4.3 and P.6.1
standard by International Electrotechnical Commission, 01/30/2008
Corrigendum 1 – Fire hazard testing – Part 10-2: Abnormal heat – Ball pressure test
Corrigenda by International Electrotechnical Commission, 02/09/2006
