Semiconductor devices – Mechanical and climatic test methods – Part 32: Flammability of plastic-encapsulated devices (externally induced) CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 11/29/2010
Flexible insulating sleeving – Part 3: Specifications for individualtypes of sleeving – Sheet 216: Heat-shrinkable, flame- retarded, limited-fire-hazard sleeving CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 12/12/2013
Amendment 1 – Medical electrical equipment – Part 2-37: Particular requirements for the basic safety and essential performance of ultrasonic medical diagnostic and monitoring equipment
Amendment by International Electrotechnical Commission, 06/08/2015
Electrical insulating materials – Determination of the effects of ionizing radiation – Part 1: Radiation interaction and dosimetry
standard by International Electrotechnical Commission, 06/27/2013
Semiconductor devices – Discrete devices – Part 2: Rectifier diodes – Section 2: Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
standard by International Electrotechnical Commission, 10/08/1993
Semiconductor devices – Part 16-3: Microwave integrated circuits – Frequency converters CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 08/16/2017
Automatic electrical controls for household and similar use – Part 2: Particular requirements for thermal motor protectors for motor-compressors of hermetic and semi-hermetic type CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 01/09/2002
Amendment 2 – Common specifications for high-voltage switchgear and controlgear standards
Amendment by International Electrotechnical Commission, 07/11/2001
Semiconductor devices – Integrated circuits – Part 21-1: Blankdetail specification for film integrated circuits and hybrid filmintegrated circuits on the basis of qualification approvalprocedures
standard by International Electrotechnical Commission, 04/10/1997
Corrigendum 1 – Insulation coordination for equipment within low-voltage systems – Part 2-1: Application guide – Explanation of the application of the IEC 60664 series, dimensioning examples and dielectric testing
standard by International Electrotechnical Commission, 10/24/2011
