IEC 60747-3-1 Ed. 1.0 b:1986

Semiconductor devices – Discrete devices – Part 3: Signal (including switching) and regulator diodes – Section One: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes
standard by International Electrotechnical Commission, 07/15/1986

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IEC 60746-5 Ed. 1.0 b:1992

Expression of performance of electrochemical analyzers – Part 5: Oxidation-reduction potential or redox potential
standard by International Electrotechnical Commission, 12/15/1992

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IEC 60601-2-43 Ed. 1.0 en:2000

Medical electrical equipment – Part 2-43: Particular requirements for the safety of X-ray equipment for interventional procedures
standard by International Electrotechnical Commission, 06/30/2000

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IEC 60644 Amd.1 Ed. 2.0 b:2019

Amendment 1 – Specification for high-voltage fuse-links for motor circuit applications
Amendment by International Electrotechnical Commission, 09/23/2019

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IEC 60749-17 Ed. 1.0 b:2003

Semiconductor devices – Mechanical and climatic test methods – Part 17: Neutron irradiation
standard by International Electrotechnical Commission, 02/20/2003

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IEC 60695-11-10 Amd.1 Ed. 1.0 b:2003

Amendment 1 – Fire hazard testing – Part 11-10: Test flames – 50 W horizontal and vertical flame test methods
Amendment by International Electrotechnical Commission, 06/26/2003

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IEC 60662 Amd.7 Ed. 1.0 b:1995

Amendment 7 – High-pressure sodium vapour lamps
Amendment by International Electrotechnical Commission, 10/25/1995

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IEC 60749-27 Ed. 2.0 b:2006

Semiconductor devices – Mechanical and climatic test methods – Part 27: Electrostatic discharge (ESD) sensitivity testing – Machine model (MM)
standard by International Electrotechnical Commission, 07/18/2006

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IEC 60695-9-1 Ed. 1.0 b:1998

Fire hazard testing – Part 9-1: Surface spread of flame – General guidance
standard by International Electrotechnical Commission, 12/10/1998

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