IEC 60793-1-40 Ed. 2.0 b:2019

Optical fibres – Part 1-40: Measurement methods and test procedures – Attenuation
standard by International Electrotechnical Commission, 03/27/2019

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IEC 60748-2-2 Ed. 1.0 b:1992

Semiconductor devices. Integrated circuits – Part 2: Digital integrated circuits – Section two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU
standard by International Electrotechnical Commission, 02/29/1992

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IEC 60738-1-4 Ed. 2.0 b:2008

Thermistors – Directly heated positive step-function temperature coefficient – Part 1-4: Blank detail specification – Sensing application – Assessment level EZ
standard by International Electrotechnical Commission, 02/13/2008

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IEC 60738-1 Amd.1 Ed. 3.0 en:2009

Amendment 1 – Thermistors – Directly heated positive temperature coefficient – Part 1: Generic specification
Amendment by International Electrotechnical Commission, 05/26/2009

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IEC 60730-2-6 Ed. 3.1 b:2019

Automatic electrical controls – Part 2-6: Particular requirements for automatic electrical pressure sensing controls including mechanical requirements CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 09/23/2019

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IEC 60684-2 Amd.1 Ed. 2.0 b:2003

Amendment 1 – Flexible insulating sleeving – Part 2: Methods of test
Amendment by International Electrotechnical Commission, 04/29/2003

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IEC 60794-1-1 Ed. 2.0 b:2001

Optical fibre cables – Part 1-1: Generic specification – General
standard by International Electrotechnical Commission, 07/31/2001

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IEC 60749-20-1 Ed. 2.0 b:2019

Semiconductor devices – Mechanical and climatic test methods – Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
standard by International Electrotechnical Commission, 06/26/2019

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IEC 60675 Amd.1 Ed. 2.0 b:1994

Amendment 1 – Household electric direct-acting room heaters – Methods for measuring performance
Amendment by International Electrotechnical Commission, 04/20/2018

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IEC 60749-26 Ed. 4.0 b:2018

Semiconductor devices – Mechanical and climatic test methods – Part 26: Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM)
standard by International Electrotechnical Commission, 01/15/2018

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