IEC 60749-10 Ed. 1.0 b CORR1:2003

Corrigendum 1 – Semiconductor devices – Mechanical and climatic test methods – Part 10: Mechanical shock
Corrigenda by International Electrotechnical Commission, 08/13/2003

IEC 60745-2-14 Ed. 2.0 b:2003

Hand-held motor-operated electric tools – Safety – Part 2-14: Particular requirements for planers
standard by International Electrotechnical Commission, 01/23/2003

IEC 60730-2-9 Ed. 4.0 b:2015

Automatic electrical controls – Part 2-9: Particular requirements for temperature sensing control
standard by International Electrotechnical Commission, 05/27/2015

IEC 60754-2 Ed. 2.0 b:2011

Test on gases evolved during combustion of materials from cables – Part 2: Determination of acidity (by pH measurement) and conductivity
standard by International Electrotechnical Commission, 11/17/2011

IEC 60728-11 Ed. 4.0 b:2016

Cable networks for television signals, sound signals and interactive services – Part 11: Safety
standard by International Electrotechnical Commission, 03/24/2016

IEC 60747-16-1 Amd.2 Ed. 1.0 b:2017

Amendment 2 – Semiconductor devices – Part 16-1: Microwave integrated circuits – Amplifiers
Amendment by International Electrotechnical Commission, 02/15/2017

IEC 60721-2-5 Ed. 1.0 b:1991

Classification of environmental conditions – Part 2: Environmental conditions appearing in nature – Section 5: Dust, sand, salt mist
standard by International Electrotechnical Commission, 07/18/1991

IEC 60747-2 Ed. 2.0 b:2000

Semiconductor devices – Discrete devices and integrated circuits – Part 2: Rectifier diodes
standard by International Electrotechnical Commission, 03/21/2000

IEC 60745-2-22 Ed. 1.0 b:2011

Hand-held motor-operated electric tools – Safety – Part 2-22: Particular requirements for cut-off machines
standard by International Electrotechnical Commission, 03/14/2011

IEC 60695-1-30 Ed. 2.0 b:2008

Fire hazard testing – Part 1-30: Guidance for assessing the fire hazard of electrotechnical products – Preselection testing process – General guidelines
standard by International Electrotechnical Commission, 07/21/2008