IEC 60730-2-19 Amd.2 Ed. 1.0 b:2007

Amendment 2 – Automatic electrical controls for household and similar use – Part 2-19: Particular requirements for electrically operated oil valves, including mechanical requirements
Amendment by International Electrotechnical Commission, 08/29/2007

IEC 60695-9-1 Ed. 2.0 b:2005

Fire hazard testing – Part 9-1: Surface spread of flame – General guidance
standard by International Electrotechnical Commission, 09/22/2005

IEC 60730-2-9 Ed. 3.1 b:2011

Automatic electrical controls for household and similar use – Part 2-9: Particular requirements for temperature sensing controls CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 06/16/2011

IEC 60720 Ed. 1.0 b:1981

Characteristics of line post insulators
standard by International Electrotechnical Commission, 01/01/1981

IEC 60748-4-3 Ed. 1.0 en:2006

Semiconductor devices – Integrated circuits – Part 4-3: Interface integrated circuits – Dynamic criteria for analogue-digital converters (ADC)
standard by International Electrotechnical Commission, 08/29/2006

IEC 60706-6 Ed. 1.0 b:1994

Guide on maintainability of equipment – Part 6: Section 9: Statistical methods in maintainability evaluation
standard by International Electrotechnical Commission, 12/21/1994

IEC 60763-3-1 Ed. 1.0 b:1992

Specification for laminated pressboard – Part 3: Specifications for individual materials – Sheet 1: Specifications for laminated precompressed board, Types LB 3.1.1, 3.1.2, 3.3.1 and 3.3.2
standard by International Electrotechnical Commission, 09/15/1992

IEC 60747-16-6 Ed. 1.0 b:2019

Semiconductor devices – Part 16-6: Microwave integrated circuits – Frequency multipliers
standard by International Electrotechnical Commission, 06/26/2019

IEC 60793-2-50 Ed. 4.0 b:2012

Optical fibres – Part 2-50: Product specifications – Sectional specification for class B single-mode fibres
standard by International Electrotechnical Commission, 12/13/2012

IEC 60749-6 Ed. 1.0 b CORR1:2003

Corrigendum 1 – Semiconductor devices – Mechanical and climatic test methods – Part 6: Storage at high temperature
Corrigenda by International Electrotechnical Commission, 08/12/2003