IEC 60728-7-1 Amd.1 Ed. 1.0 b:2015

Amendment 1 – Cable networks for television signals, sound signals and interactive services – Part 7-1: Hybrid Fibre Coax Outside Plant status monitoring – Physical (PHY) layer specification
Amendment by International Electrotechnical Commission, 04/29/2015

IEC 60793-2-10 Ed. 3.0 b:2007

Optical fibres – Part 2-10: Product specifications – Sectional specification for category A1 multimode fibres
standard by International Electrotechnical Commission, 06/05/2007

IEC 60747-5-2 Amd.1 Ed. 1.0 b:2002

Amendment 1 – Discrete semiconductor devices and integrated circuits – Part 5-2: Optoelectronic devices – Essential ratings and characteristics
Amendment by International Electrotechnical Commission, 03/25/2002

IEC 60745-2-13 Ed. 1.0 b:1989

Safety of hand-held motor-operated electric tools. Part 2: Particular requirements for chain saws
standard by International Electrotechnical Commission, 05/30/1989

IEC 60758 Ed. 5.0 en:2016

Synthetic quartz crystal – Specifications and guidelines for use
standard by International Electrotechnical Commission, 05/18/2016

IEC 60747-19-1 Ed. 1.0 en:2019

Semiconductor devices – Part 19-1: Smart sensors – Control scheme of smart sensors
standard by International Electrotechnical Commission, 11/22/2019

IEC 60730-2-3 Amd.1 Ed. 1.0 b:1995

Amendment 1 – Automatic electrical controls for household and similar use. Part 2: Particular requirements for thermal protectors for ballasts for tubular fluorescent lamps
Amendment by International Electrotechnical Commission, 09/13/1995

IEC 60749-6 Ed. 1.0 b:2002

Semiconductor devices – Mechanical and climatic test methods – Part 6: Storage at high temperature
standard by International Electrotechnical Commission, 04/12/2002

IEC 60758 Ed. 3.0 en:2004

Synthetic quartz crystal – Specifications and guide to the use
standard by International Electrotechnical Commission, 12/14/2004

IEC 60749-5 Ed. 2.0 en:2017

Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
standard by International Electrotechnical Commission, 04/10/2017