Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
standard by International Electrotechnical Commission, 04/10/2017
Semiconductor devices – Mechanical and climatic test methods – Part 34: Power cycling
standard by International Electrotechnical Commission, 10/28/2010
Thermistors – Directly heated positive temperature coefficient – Part 1: Generic specification
standard by International Electrotechnical Commission, 04/10/2006
Semiconductor devices – Discrete devices – Part 8: Field-effect transistors – Section two: Blank detail specification for field-effect transistors for case-rated power amplifier applications
standard by International Electrotechnical Commission, 02/15/1993
Amendment 2 – Hand-held motor-operated electric tools – Safety – Part 1: General requirements
Amendment by International Electrotechnical Commission, 06/30/2003
Corrigendum 1 – Expression of performance of electrochemical analyzers – Part 2: pH value
Corrigenda by International Electrotechnical Commission, 05/15/2003
Semiconductor devices – Mechanical and climatic test methods – Part 26: Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM)
standard by International Electrotechnical Commission, 10/21/2003
Amendment 2 – Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
Amendment by International Electrotechnical Commission, 02/08/1994
Optical fibres – Part 1-48: Measurement methods and test procedures – Polarization mode dispersion
standard by International Electrotechnical Commission, 05/19/2003
Thermistors – Directly heated positive step-function temperature coefficient – Part 1-1: Blank detail specification – Current limiting application – Assessment leve EZ
standard by International Electrotechnical Commission, 02/13/2008
