IEC 60793-1-54 Ed. 2.0 b:2012

Optical fibres – Part 1-54: Measurement methods and test procedures – Gamma irradiation
standard by International Electrotechnical Commission, 10/25/2012

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IEC 60749-22 Ed. 1.0 b CORR1:2003

Corrigendum 1 – Semiconductor devices – Mechanical and climatic test methods – Part 22: Bond strength
Corrigenda by International Electrotechnical Commission, 08/13/2003

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IEC 60747-16-4 Amd.1 Ed. 1.0 en:2009

Amendment 1 – Semiconductor devices – Part 16-4: Microwave integrated circuits – Switches
Amendment by International Electrotechnical Commission, 03/10/2009

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IEC 60747-7 Ed. 3.1 b:2019

Semiconductor devices – Discrete devices – Part 7: Bipolar transistors
standard by International Electrotechnical Commission, 09/23/2019

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IEC 60754-2 Amd.1 Ed. 2.0 b:2019

Amendment 1 – Test on gases evolved during combustion of materials from cables – Part 2: Determination of acidity (by pH measurement) and conductivity
Amendment by International Electrotechnical Commission, 11/25/2019

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IEC 60793-1-20 Ed. 1.0 b:2001

Optical fibres – Part 1-20: Measurement methods and test procedures – Fibre geometry
standard by International Electrotechnical Commission, 09/17/2001

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IEC 60749-30 Ed. 1.1 b:2011

Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 08/10/2011

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IEC 60774-3 Ed. 2.0 b:1993

Helical-scan video tape cassette system using 12,65 mm (0,5 in) magnetic tape on type VHS – Part 3: S-VHS
standard by International Electrotechnical Commission, 10/15/1993

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IEC 60794-2-30 Ed. 2.0 b:2008

Optical fibre cables – Part 2-30: Indoor cables – Family specification for ribbon cables
standard by International Electrotechnical Commission, 10/08/2008

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IEC 60760 Amd.1 Ed. 2.0 b:1993

Amendment 1 – Flat, quick-connect terminations
Amendment by International Electrotechnical Commission, 07/29/1993

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