IEC 60811-1-1 Ed. 2.1 b:2001

Common test methods for insulating and sheathing materials of electric cables and optical cables – Part 1-1: Methods for general application – Measurement of thickness and overall dimensions – Tests for determining the mechanical properties CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 07/04/2001

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IEC 60851-3 Ed. 2.1 b:1997

Winding wires – Test methods – Part 3: Mechanical properties CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 12/11/1997

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IEC 60850 Ed. 3.0 b:2007

Railway applications – Supply voltages of traction systems
standard by International Electrotechnical Commission, 02/23/2007

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IEC 60904-10 Ed. 2.0 b:2009

Photovoltaic devices – Part 10: Methods of linearity measurement
standard by International Electrotechnical Commission, 12/17/2009

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IEC 60915 Ed. 2.0 en CORR1:2007

Corrigendum 1 – Fixed capacitors for use in electronic equipment – Preferred dimensions of shaft ends, bushes and for the mounting of single-hole, bush-mounted, shaft-operated electronic components
Corrigenda by International Electrotechnical Commission, 05/23/2007

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IEC 60809 Amd.3 Ed. 2.0 b:2004

Amendment 3 – Lamps for road vehicles – Dimensional, electrical and luminous requirements
Amendment by International Electrotechnical Commission, 05/17/2004

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IEC 60832 Ed. 1.0 b:1988

Insulating poles (insulating sticks) and universal tool attachments (fittings) for live working
standard by International Electrotechnical Commission, 04/15/1988

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IEC 60883 Ed. 1.0 b:1987

Measuring method for chrominance signal-to-random noise ratio for video tape recorders
standard by International Electrotechnical Commission, 04/15/1987

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IEC 60851-4 Amd.2 Ed. 2.0 b:2005

Amendment 2 – Winding wires – Test methods – Part 4: Chemical properties
Amendment by International Electrotechnical Commission, 01/27/2005

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IEC 60891 Ed. 1.0 b:1987

Procedures for temperature and irradiance corrections to measured I-V characteristics of crystalline silicon photovoltaic devices
standard by International Electrotechnical Commission, 04/15/1987

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