IEC 60811-410 Amd.1 Ed. 1.0 b:2017

Amendment 1 – Electric and optical fibre cables – Test methods for non-metallic materials – Part 410: Miscellaneous tests – Test method for copper-catalyzed oxidative degradation of polyolefin insulated conductors
Amendment by International Electrotechnical Commission, 07/21/2017

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IEC 60853-3 Ed. 1.0 b:2002

Calculation of the cyclic and emergency current rating of cables – Part 3: Cyclic rating factor for cables of all voltages, with partial drying of the soil
standard by International Electrotechnical Commission, 02/18/2002

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IEC 60861 Ed. 2.0 b:2006

Equipment for monitoring of radionuclides in liquid effluents and surface waters
standard by International Electrotechnical Commission, 08/21/2006

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IEC 61082-4 Ed. 1.0 b:1996

Preparation of documents used in electrotechnology – Part 4: Location and installation documents
standard by International Electrotechnical Commission, 03/13/1996

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IEC 61078 Ed. 1.0 b:1991

Analysis techniques for dependability – Reliability block diagram method
standard by International Electrotechnical Commission, 11/28/1991

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IEC 60974-11 Ed. 2.0 b:2004

Arc welding equipment – Part 11: Electrode holders
standard by International Electrotechnical Commission, 07/15/2004

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IEC 60947-7-3 Ed. 1.0 b CORR1:2003

Corrigendum 1 – Low-voltage switchgear and controlgear – Part 7-3: Ancillary equipment – Safety requirements for fuse terminal blocks
Corrigenda by International Electrotechnical Commission, 03/20/2003

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IEC 60810 Ed. 3.1 b:2008

Lamps for road vehicles – Performance requirements CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 10/15/2008

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IEC 60915 Ed. 2.0 b CORR1:2008

Corrigendum 1 – Fixed capacitors for use in electronic equipment – Preferred dimensions of shaft ends, bushes and for the mounting of single-hole, bush-mounted, shaft-operated electronic components
Corrigenda by International Electrotechnical Commission, 12/09/2008

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IEC 60869-1 Ed. 3.0 b:1999

Fibre optic attenuators – Part 1: Generic specification
standard by International Electrotechnical Commission, 11/30/1999

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