JEDEC JESD22-B111
BOARD LEVEL DROP TEST METHOD OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTS
standard by JEDEC Solid State Technology Association, 07/01/2003
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BOARD LEVEL DROP TEST METHOD OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTS
standard by JEDEC Solid State Technology Association, 07/01/2003
SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT
standard by JEDEC Solid State Technology Association, 11/01/2008
ADDENDUM No. 7 to JESD24 – COMMUTATING DIODE SAFE OPERATING AREA TEST PROCEDURE FOR MEASURING dv/dt DURING REVERSE RECOVERY OF POWER TRANSISTORS
Amendment by JEDEC Solid State Technology Association, 08/01/1982
NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 10/01/2012
Inspection Criteria for Microelectronic Packages and Covers
standard by JEDEC Solid State Technology Association, 05/01/2017
DRIVER SPECIFICATIONS FOR 1.8 V POWER SUPPLY POINT-TO-POINT DRIVERS
standard by JEDEC Solid State Technology Association, 11/01/2004
STANDARD FOR DEFINITION OF CU877 PLL CLOCK DRIVER FOR REGISTERED DDR2 DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 02/01/2004
Solid-State Drive (SSD) Endurance Workloads
standard by JEDEC Solid State Technology Association, 07/01/2012
CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY SEMICONDUCTOR SUPPLIERS
standard by JEDEC Solid State Technology Association, 12/01/2011
, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
standard by JEDEC Solid State Technology Association, 12/01/2015