JEDEC JESD6 (R2002)
MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
standard by JEDEC Solid State Technology Association, 02/01/1967
- Comments Off on JEDEC JESD6 (R2002)
- JEDEC
MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
standard by JEDEC Solid State Technology Association, 02/01/1967
POWER MOSFET ELECTRICAL DOSE RATE TEST METHOD
standard by JEDEC Solid State Technology Association, 08/01/1989
STANDARD MANUFACTURER'S IDENTIFICATION CODE
standard by JEDEC Solid State Technology Association, 01/01/2014
Terms, Definitions, and Letter Symbols for Microelectronic Devices
standard by JEDEC Solid State Technology Association, 12/01/2012
1.0 V +/- 0.1 V (NORMAL RANGE) AND 0.7 V – 1.1 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2007
DEFINITION OF THE SSTU32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007
USER GUIDELINES FOR IR THERMAL IMAGING DETERMINATION OF DIE TEMPERATURE
standard by JEDEC Solid State Technology Association, 09/01/1999
GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 09/01/2003
METHODOLOGY FOR THE THERMAL MEASUREMENT OF COMPONENT PACKAGES (SINGLE SEMICONDUCTOR DEVICE)
standard by JEDEC Solid State Technology Association, 12/01/1995
JOINT IPC/JEDEC STANDARD FOR MOISTURE/REFLOW SENSITIVITY CLASSIFICATION FOR NONHERMETIC SOLID STATE SURFACE-MOUNT DEVICES
standard by JEDEC Solid State Technology Association, 03/01/2008