JEDEC JESD22-A117C

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 10/01/2011

JEDEC JESD22-A106B

THERMAL SHOCK
standard by JEDEC Solid State Technology Association, 06/01/2004

JEDEC JESD51-12

GUIDELINES FOR REPORTING AND USING ELECTRONIC PACKAGE THERMAL INFORMATION
standard by JEDEC Solid State Technology Association, 05/01/2005

JEDEC JESD22-A114F

ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM)
standard by JEDEC Solid State Technology Association, 12/01/2008

JEDEC JESD25 (R2002)

MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS
standard by JEDEC Solid State Technology Association, 11/01/1972

JEDEC JEP 148A

RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 12/01/2008

JEDEC JESD75-5

SON/QFN PACKAGE PINOUTS STANDARDIZED FOR 1-, 2-, AND 3-BIT LOGIC FUNCTIONS
standard by JEDEC Solid State Technology Association, 07/01/2004

JEDEC JESD230C

NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 10/01/2016

JEDEC JESD22-A110D

HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 11/01/2010

JEDEC JESD284-A (R2002)

TEST METHODS FOR THE COLLECTOR-BASE TIME CONSTANT AND FOR THE RESISTIVE PART OF THE COMMON-EMITTER INPUT IMPEDANCE
standard by JEDEC Solid State Technology Association, 11/01/1963