JEDEC JESD219A_MT

Master Trace for 128 GB SSD
Directive by JEDEC Solid State Technology Association, 07/01/2012

JEDEC JESD47H

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 02/01/2011

JEDEC JESD237

Reliability Qualification of Power Amplifier Modules
standard by JEDEC Solid State Technology Association, 03/01/2014

JEDEC JESD51-53

TERMS, DEFINITIONS AND UNITS GLOSSARY FOR LED THERMAL TESTING
standard by JEDEC Solid State Technology Association, 05/01/2012

JEDEC JESD51-10

TEST BOARDS FOR THROUGH-HOLE PERIMETER LEADED PACKAGE THERMAL MEASUREMENTS
standard by JEDEC Solid State Technology Association, 07/01/2000

JEDEC JEP 122E

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 03/01/2009

JEDEC JESD8-21B

POD135 – 1.35 V PSEUDO OPEN DRAIN I/O
standard by JEDEC Solid State Technology Association, 03/01/2018

JEDEC JESD22-A110E

HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 07/01/2015

JEDEC JESD 12-6

ADDENDUM No. 6 to JESD12 – INTERFACE STANDARD FOR SEMICUSTOM INTEGRATED CIRCUITS
Amendment by JEDEC Solid State Technology Association, 03/01/1991

JEDEC JESD20

STANDARD FOR DESCRIPTION OF 54/74ACXXXXX AND 54/74ACTXXXXX ADVANCED HIGH-SPEED CMOS DEVICES
standard by JEDEC Solid State Technology Association, 09/01/1990