JEDEC JESD 22-B114
MARK LEGIBILITY
standard by JEDEC Solid State Technology Association, 03/01/2008
- Comments Off on JEDEC JESD 22-B114
- JEDEC
MARK LEGIBILITY
standard by JEDEC Solid State Technology Association, 03/01/2008
HIGH TEMPERATURE STORAGE LIFE
standard by JEDEC Solid State Technology Association, 12/01/2010
DEFINITION OF THE SSTU32S869 & SSTU32D869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 04/01/2007
METAL PACKAGE SPECIFICATION FOR MICROELECTRONIC PACKAGES AND COVERS
standard by JEDEC Solid State Technology Association, 04/01/1987
STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
standard by JEDEC Solid State Technology Association, 03/01/2009
Characterization of Interfacial Adhesion in Semiconductor Packages
standard by JEDEC Solid State Technology Association, 04/01/2013
GUIDE FOR THE PRODUCTION AND ACQUISITION OF RADIATION-HARDNESS ASSURED MULTICHIP MODULES AND HYBRID MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 01/01/2010
Graphics Double Data Rate (GDDR5X) SGRAM Standard
standard by JEDEC Solid State Technology Association, 11/01/2015
METHOD OF DIODE Q MEASUREMENT
standard by JEDEC Solid State Technology Association, 11/01/1981
DICTIONARY OF TERMS FOR SOLID STATE TECHNOLOGY, FOURTH EDITION
standard by JEDEC Solid State Technology Association, 07/01/2007