IEC 60749-36 Ed. 1.0 b:2003

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Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Product Details

Edition:

1.0

Published:

02/13/2003

Number of Pages:

7

File Size:

1 file , 210 KB