IEC 60749-4 Ed. 1.0 b:2002
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- IEC
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Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
Product Details
- Edition:
- 1.0
- Published:
- 04/12/2002
- Number of Pages:
- 15
- File Size:
- 1 file , 510 KB
