IEC 60749-6 Ed. 1.0 b:2002
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- IEC
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Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.
Product Details
- Edition:
- 1.0
- Published:
- 04/12/2002
- Number of Pages:
- 7
- File Size:
- 1 file , 380 KB
