IEC 60749-7 Ed. 1.0 b:2002

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Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.

Product Details

Edition:

1.0

Published:

04/09/2002

Number of Pages:

15

File Size:

1 file , 430 KB