
IEC 61788-3 Ed. 1.0 en:2000
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- IEC
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Covers a test method for the determination of the d.c. critical current of short and straight Ag- or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors that have a monolithic structure and a shape of round wire or flat or square tape containing mono- or multicores of oxides.
Product Details
- Edition:
- 1.0
- Published:
- 12/14/2000
- Number of Pages:
- 21
- File Size:
- 1 file , 170 KB